Defect Aware Test Patterns
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Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, Irith Pomeranz
Defect Aware Test Patterns
DATE, 2005.

DATE 2005
Full names Links ISxN
	author        = "Huaxing Tang and Gang Chen and Sudhakar M. Reddy and Chen Wang and Janusz Rajski and Irith Pomeranz",
	booktitle     = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2005.110",
	isbn          = "0-7695-2288-2",
	pages         = "450--455",
	publisher     = "{IEEE Computer Society}",
	title         = "{Defect Aware Test Patterns}",
	year          = 2005,


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