Ilia Polian, Hideo Fujiwara
Functional constraints vs. test compression in scan-based delay testing
DATE, 2006.
@inproceedings{DATE-2006-PolianF,
author = "Ilia Polian and Hideo Fujiwara",
booktitle = "{Proceedings of the 10th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1131769",
pages = "1039--1044",
publisher = "{European Design and Automation Association, Leuven, Belgium}",
title = "{Functional constraints vs. test compression in scan-based delay testing}",
year = 2006,
}