Jan Schat
Fault Clustering in deep-submicron CMOS Processes
DATE, 2008.
@inproceedings{DATE-2008-Schat,
author = "Jan Schat",
booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2008.4484900",
isbn = "978-3-9810801-3-1",
pages = "511--514",
publisher = "{IEEE}",
title = "{Fault Clustering in deep-submicron CMOS Processes}",
year = 2008,
}











