PWM-Based Test Stimuli Generation for BIST of High Resolution ADCs
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Daniela De Venuto, Leonardo Reyneri
PWM-Based Test Stimuli Generation for BIST of High Resolution ADCs
DATE, 2008.

DATE 2008
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@inproceedings{DATE-2008-VenutoR,
	author        = "Daniela De Venuto and Leonardo Reyneri",
	booktitle     = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2008.4484899",
	isbn          = "978-3-9810801-3-1",
	pages         = "284--287",
	publisher     = "{IEEE}",
	title         = "{PWM-Based Test Stimuli Generation for BIST of High Resolution ADCs}",
	year          = 2008,
}

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