Test Instrumentation for a Laser Scanning Localization Technique for Analysis of High Speed DRAM devices
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Martin Versen, Achim Schramm, Jan Schnepp, Dorina Diaconescu
Test Instrumentation for a Laser Scanning Localization Technique for Analysis of High Speed DRAM devices
DATE, 2008.

DATE 2008
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@inproceedings{DATE-2008-VersenSSD,
	author        = "Martin Versen and Achim Schramm and Jan Schnepp and Dorina Diaconescu",
	booktitle     = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2008.4484909",
	isbn          = "978-3-9810801-3-1",
	pages         = "776--779",
	publisher     = "{IEEE}",
	title         = "{Test Instrumentation for a Laser Scanning Localization Technique for Analysis of High Speed DRAM devices}",
	year          = 2008,
}

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