Travelled to:
1 × Germany
Collaborated with:
M.Versen A.Schramm D.Diaconescu
Talks about:
instrument (1) techniqu (1) analysi (1) speed (1) local (1) laser (1) devic (1) test (1) scan (1) high (1)
Person: Jan Schnepp
DBLP: Schnepp:Jan
Contributed to:
Wrote 1 papers:
- DATE-2008-VersenSSD #analysis #locality
- Test Instrumentation for a Laser Scanning Localization Technique for Analysis of High Speed DRAM devices (MV, AS, JS, DD), pp. 776–779.