Capturing and Analyzing IC Design Productivity Metrics
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Jonathan Young
Capturing and Analyzing IC Design Productivity Metrics
DATE, 2008.

DATE 2008
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@inproceedings{DATE-2008-Young,
	author        = "Jonathan Young",
	booktitle     = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2008.4484797",
	isbn          = "978-3-9810801-3-1",
	pages         = "936--937",
	publisher     = "{IEEE}",
	title         = "{Capturing and Analyzing IC Design Productivity Metrics}",
	year          = 2008,
}

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