Multi-temperature testing for core-based system-on-chip
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Zhiyuan He, Zebo Peng, Petru Eles
Multi-temperature testing for core-based system-on-chip
DATE, 2010.

DATE 2010
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@inproceedings{DATE-2010-HePE,
	author        = "Zhiyuan He and Zebo Peng and Petru Eles",
	booktitle     = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}",
	pages         = "208--213",
	publisher     = "{IEEE}",
	title         = "{Multi-temperature testing for core-based system-on-chip}",
	year          = 2010,
}

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