Travelled to:
2 × Germany
Collaborated with:
Z.Peng P.Eles
Talks about:
test (3) temperatur (1) constrain (1) schedul (1) probabl (1) system (1) partit (1) driven (1) defect (1) power (1)
Person: Zhiyuan He
DBLP: He:Zhiyuan
Contributed to:
Wrote 2 papers:
- DATE-2010-HePE #multi #testing
- Multi-temperature testing for core-based system-on-chip (ZH, ZP, PE), pp. 208–213.
- DATE-2006-HePE #clustering #scheduling #testing
- Power constrained and defect-probability driven SoC test scheduling with test set partitioning (ZH, ZP, PE), pp. 291–296.