Erik Jan Marinissen
Testing TSV-based three-dimensional stacked ICs
DATE, 2010.
@inproceedings{DATE-2010-Marinissen, author = "Erik Jan Marinissen", booktitle = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}", pages = "1689--1694", publisher = "{IEEE}", title = "{Testing TSV-based three-dimensional stacked ICs}", year = 2010, }