Erik Jan Marinissen
Testing TSV-based three-dimensional stacked ICs
DATE, 2010.
@inproceedings{DATE-2010-Marinissen,
author = "Erik Jan Marinissen",
booktitle = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}",
pages = "1689--1694",
publisher = "{IEEE}",
title = "{Testing TSV-based three-dimensional stacked ICs}",
year = 2010,
}











