Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs)
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Mahdi Fazeli, Seyed Nematollah Ahmadian, Seyed Ghassem Miremadi, Hossein Asadi, Mehdi Baradaran Tahoori
Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs)
DATE, 2011.

DATE 2011
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@inproceedings{DATE-2011-FazeliAMAT,
	author        = "Mahdi Fazeli and Seyed Nematollah Ahmadian and Seyed Ghassem Miremadi and Hossein Asadi and Mehdi Baradaran Tahoori",
	booktitle     = "{Proceedings of the 15th Conference on Design, Automation and Test in Europe}",
	isbn          = "978-1-61284-208-0",
	pages         = "70--75",
	publisher     = "{IEEE}",
	title         = "{Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs)}",
	year          = 2011,
}

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