Min Li, Michael S. Hsiao
RAG: An efficient reliability analysis of logic circuits on graphics processing units
DATE, 2012.
@inproceedings{DATE-2012-LiH,
acmid = "2492787",
author = "Min Li and Michael S. Hsiao",
booktitle = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
isbn = "978-1-4577-2145-8",
pages = "316--319",
publisher = "{IEEE}",
title = "{RAG: An efficient reliability analysis of logic circuits on graphics processing units}",
year = 2012,
}