EDA solutions to new-defect detection in advanced process technologies
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Erik Jan Marinissen, Gilbert Vandling, Sandeep Kumar Goel, Friedrich Hapke, Jason Rivers, Nikolaus Mittermaier, Swapnil Bahl
EDA solutions to new-defect detection in advanced process technologies
DATE, 2012.

DATE 2012
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@inproceedings{DATE-2012-MarinissenVGHRMB,
	acmid         = "2492738",
	author        = "Erik Jan Marinissen and Gilbert Vandling and Sandeep Kumar Goel and Friedrich Hapke and Jason Rivers and Nikolaus Mittermaier and Swapnil Bahl",
	booktitle     = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
	isbn          = "978-1-4577-2145-8",
	pages         = "123--128",
	publisher     = "{IEEE}",
	title         = "{EDA solutions to new-defect detection in advanced process technologies}",
	year          = 2012,
}

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