A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories
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Cristian Zambelli, Marco Indaco, Michele Fabiano, Stefano Di Carlo, Paolo Prinetto, Piero Olivo, Davide Bertozzi
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories
DATE, 2012.

DATE 2012
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@inproceedings{DATE-2012-ZambelliIFCPOB,
	acmid         = "2492931",
	author        = "Cristian Zambelli and Marco Indaco and Michele Fabiano and Stefano Di Carlo and Paolo Prinetto and Piero Olivo and Davide Bertozzi",
	booktitle     = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
	isbn          = "978-1-4577-2145-8",
	pages         = "881--886",
	publisher     = "{IEEE}",
	title         = "{A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories}",
	year          = 2012,
}

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