Robert Aitken, Görschwin Fey, Zbigniew T. Kalbarczyk, Frank Reichenbach, Matteo Sonza Reorda
Reliability analysis reloaded: how will we survive?
DATE, 2013.
@inproceedings{DATE-2013-AitkenFKRR,
	acmid         = "2485376",
	author        = "Robert Aitken and Görschwin Fey and Zbigniew T. Kalbarczyk and Frank Reichenbach and Matteo Sonza Reorda",
	booktitle     = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
	isbn          = "978-1-4503-2153-2",
	pages         = "358--367",
	publisher     = "{EDA Consortium San Jose, CA, USA / ACM DL}",
	title         = "{Reliability analysis reloaded: how will we survive?}",
	year          = 2013,
}
 
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