Mudit Bhargava, Ken Mai
An efficient reliable PUF-based cryptographic key generator in 65nm CMOS
DATE, 2014.
@inproceedings{DATE-2014-BhargavaM,
author = "Mudit Bhargava and Ken Mai",
booktitle = "{Proceedings of the 18th Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.7873/DATE.2014.083",
pages = "1--6",
publisher = "{IEEE}",
title = "{An efficient reliable PUF-based cryptographic key generator in 65nm CMOS}",
year = 2014,
}











