Satya Trinadh, Ch. Sobhan Babu, Shiv Govind Singh, Seetal Potluri, V. Kamakoti
DP-fill: a dynamic programming approach to X-filling for minimizing peak test power in scan tests
DATE, 2015.
@inproceedings{DATE-2015-TrinadhBSPK,
acmid = "2755943",
author = "Satya Trinadh and Ch. Sobhan Babu and Shiv Govind Singh and Seetal Potluri and V. Kamakoti",
booktitle = "{Proceedings of the 19th Conference and Exhibition on Design, Automation and Test in Europe}",
isbn = "978-3-9815370-4-8",
pages = "836--841",
publisher = "{ACM}",
title = "{DP-fill: a dynamic programming approach to X-filling for minimizing peak test power in scan tests}",
year = 2015,
}











