Model Order Reduction for nanoelectronics coupled problems with many inputs
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Nicodemus Banagaaya, Lihong Feng, Wim Schoenmaker, Peter Meuris, Aarnout Wieers, Renaud Gillon, Peter Benner
Model Order Reduction for nanoelectronics coupled problems with many inputs
DATE, 2016.

DATE 2016
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@inproceedings{DATE-2016-BanagaayaFSMWGB,
	author        = "Nicodemus Banagaaya and Lihong Feng and Wim Schoenmaker and Peter Meuris and Aarnout Wieers and Renaud Gillon and Peter Benner",
	booktitle     = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
	ee            = "http://ieeexplore.ieee.org/document/7459329/",
	isbn          = "978-3-9815-3707-9",
	pages         = "313--318",
	publisher     = "{IEEE}",
	title         = "{Model Order Reduction for nanoelectronics coupled problems with many inputs}",
	year          = 2016,
}


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