Nicodemus Banagaaya, Lihong Feng, Wim Schoenmaker, Peter Meuris, Aarnout Wieers, Renaud Gillon, Peter Benner
Model Order Reduction for nanoelectronics coupled problems with many inputs
DATE, 2016.
@inproceedings{DATE-2016-BanagaayaFSMWGB,
author = "Nicodemus Banagaaya and Lihong Feng and Wim Schoenmaker and Peter Meuris and Aarnout Wieers and Renaud Gillon and Peter Benner",
booktitle = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
ee = "http://ieeexplore.ieee.org/document/7459329/",
isbn = "978-3-9815-3707-9",
pages = "313--318",
publisher = "{IEEE}",
title = "{Model Order Reduction for nanoelectronics coupled problems with many inputs}",
year = 2016,
}