Exploiting process variation for retention induced refresh minimization on flash memory
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Yejia Di, Liang Shi, Kaijie Wu 0001, Chun Jason Xue
Exploiting process variation for retention induced refresh minimization on flash memory
DATE, 2016.

DATE 2016
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@inproceedings{DATE-2016-DiSWX,
	author        = "Yejia Di and Liang Shi and Kaijie Wu 0001 and Chun Jason Xue",
	booktitle     = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
	ee            = "http://ieeexplore.ieee.org/document/7459342/",
	isbn          = "978-3-9815-3707-9",
	pages         = "391--396",
	publisher     = "{IEEE}",
	title         = "{Exploiting process variation for retention induced refresh minimization on flash memory}",
	year          = 2016,
}


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