BibSLEIGH — Exploiting transaction level models for observability-aware post-silicon test generation

Farimah Farahmandi, Prabhat Mishra 0001, Sandip Ray
Exploiting transaction level models for observability-aware post-silicon test generation
DATE, 2016.

DATE 2016

@inproceedings{DATE-2016-FarahmandiMR,
	author        = "Farimah Farahmandi and Prabhat Mishra 0001 and Sandip Ray",
	booktitle     = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
	ee            = "http://ieeexplore.ieee.org/document/7459544/",
	isbn          = "978-3-9815-3707-9",
	pages         = "1477--1480",
	publisher     = "{IEEE}",
	title         = "{Exploiting transaction level models for observability-aware post-silicon test generation}",
	year          = 2016,
}

Farimah Farahmandi, Prabhat Mishra 0001, Sandip RayExploiting transaction level models for observability-aware post-silicon test generationDATE, 2016.

Farimah Farahmandi, Prabhat Mishra 0001, Sandip Ray
Exploiting transaction level models for observability-aware post-silicon test generation
DATE, 2016.