Anton Karputkin, Jaan Raik
A synthesis-agnostic behavioral fault model for high gate-level fault coverage
DATE, 2016.
@inproceedings{DATE-2016-KarputkinR,
author = "Anton Karputkin and Jaan Raik",
booktitle = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
ee = "http://ieeexplore.ieee.org/document/7459477/",
isbn = "978-3-9815-3707-9",
pages = "1124--1127",
publisher = "{IEEE}",
title = "{A synthesis-agnostic behavioral fault model for high gate-level fault coverage}",
year = 2016,
}