Taesik Na, Saibal Mukhopadhyay
Behavioral modeling of timing slack variation in digital circuits due to power supply noise
DATE, 2016.
@inproceedings{DATE-2016-NaM,
	author        = "Taesik Na and Saibal Mukhopadhyay",
	booktitle     = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
	ee            = "http://ieeexplore.ieee.org/document/7459322/",
	isbn          = "978-3-9815-3707-9",
	pages         = "281--284",
	publisher     = "{IEEE}",
	title         = "{Behavioral modeling of timing slack variation in digital circuits due to power supply noise}",
	year          = 2016,
}