Taesik Na, Saibal Mukhopadhyay
Behavioral modeling of timing slack variation in digital circuits due to power supply noise
DATE, 2016.
@inproceedings{DATE-2016-NaM,
author = "Taesik Na and Saibal Mukhopadhyay",
booktitle = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
ee = "http://ieeexplore.ieee.org/document/7459322/",
isbn = "978-3-9815-3707-9",
pages = "281--284",
publisher = "{IEEE}",
title = "{Behavioral modeling of timing slack variation in digital circuits due to power supply noise}",
year = 2016,
}