Marc Riera, Ramon Canal, Jaume Abella, Antonio González 0001
A detailed methodology to compute Soft Error Rates in advanced technologies
DATE, 2016.
@inproceedings{DATE-2016-RieraCA0,
author = "Marc Riera and Ramon Canal and Jaume Abella and Antonio González 0001",
booktitle = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
ee = "http://ieeexplore.ieee.org/document/7459307/",
isbn = "978-3-9815-3707-9",
pages = "217--222",
publisher = "{IEEE}",
title = "{A detailed methodology to compute Soft Error Rates in advanced technologies}",
year = 2016,
}