A low overhead error confinement method based on application statistical characteristics
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Zheng Wang 0020, Georgios Karakonstantis, Anupam Chattopadhyay
A low overhead error confinement method based on application statistical characteristics
DATE, 2016.

DATE 2016
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@inproceedings{DATE-2016-WangKC,
	author        = "Zheng Wang 0020 and Georgios Karakonstantis and Anupam Chattopadhyay",
	booktitle     = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
	ee            = "http://ieeexplore.ieee.org/document/7459488/",
	isbn          = "978-3-9815-3707-9",
	pages         = "1168--1171",
	publisher     = "{IEEE}",
	title         = "{A low overhead error confinement method based on application statistical characteristics}",
	year          = 2016,
}


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