Fotios Vartziotis, Xrysovalantis Kavousianos
Critical path - Oriented & thermal aware X-filling for high un-modeled defect coverage
DATE, 2017.
@inproceedings{DATE-2017-VartziotisK,
author = "Fotios Vartziotis and Xrysovalantis Kavousianos",
booktitle = "{Proceedings of the 21st Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2017.7927067",
isbn = "978-3-9815370-8-6",
pages = "642--645",
publisher = "{IEEE}",
title = "{Critical path - Oriented & thermal aware X-filling for high un-modeled defect coverage}",
year = 2017,
}