Fotios Vartziotis, Xrysovalantis Kavousianos
Critical path - Oriented & thermal aware X-filling for high un-modeled defect coverage
DATE, 2017.
@inproceedings{DATE-2017-VartziotisK,
	author        = "Fotios Vartziotis and Xrysovalantis Kavousianos",
	booktitle     = "{Proceedings of the 21st Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2017.7927067",
	isbn          = "978-3-9815370-8-6",
	pages         = "642--645",
	publisher     = "{IEEE}",
	title         = "{Critical path - Oriented & thermal aware X-filling for high un-modeled defect coverage}",
	year          = 2017,
}