Travelled to:2 × France
4 × Germany
Collaborated with:K.Chakrabarty E.Kalligeros V.Tenentes D.Nikolos S.Balatsouka M.Koutsoupia F.Vartziotis R.A.Parekhji A.Jain
Talks about:test (8) compress (3) data (3) defect (2) power (2) multi (2) core (2) use (2) set (2) multilevel (1)
Person: Xrysovalantis Kavousianos
DBLP: Kavousianos:Xrysovalantis
Contributed to:
201420132010200920082006Wrote 7 papers:
- DATE-2014-VartziotisKCPJ #multi #optimisation #using
- Multi-site test optimization for multi-Vdd SoCs using space- and time- division multiplexing (FV, XK, KC, RAP, AJ), pp. 1–6.
- DATE-2013-KavousianosC #testing
- Testing for SoCs with advanced static and dynamic power-management capabilities (XK, KC), pp. 737–742.
- DATE-2010-BalatsoukaTKC #fault #power management #testing
- Defect aware X-filling for low-power scan testing (SB, VT, XK, KC), pp. 873–878.
- DATE-2009-KavousianosC #fault #generative #testing
- Generation of compact test sets with high defect coverage (XK, KC), pp. 1130–1135.
- DATE-2009-KoutsoupiaKKN #self #testing
- LFSR-based test-data compression with self-stoppable seeds (MK, EK, XK, DN), pp. 1482–1487.
- DATE-2008-TenentesKK #testing
- State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores (VT, XK, EK), pp. 474–479.
- DATE-2006-KavousianosKN #multi #performance #testing #using
- Efficient test-data compression for IP cores using multilevel Huffman coding (XK, EK, DN), pp. 1033–1038.