Marcello Dalpasso, Davide Bertozzi, Michele Favalli
A Boolean model for delay fault testing of emerging digital technologies based on ambipolar devices
DATE, 2018.
@inproceedings{DATE-2018-DalpassoBF,
author = "Marcello Dalpasso and Davide Bertozzi and Michele Favalli",
booktitle = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2018.8342024",
isbn = "978-3-9819263-0-9",
pages = "297--300",
publisher = "{IEEE}",
title = "{A Boolean model for delay fault testing of emerging digital technologies based on ambipolar devices}",
year = 2018,
}