Kira Kraft, Chirag Sudarshan, Deepak M. Mathew, Christian Weis, Norbert Wehn, Matthias Jung 0001
Improving the error behavior of DRAM by exploiting its Z-channel property
DATE, 2018.
@inproceedings{DATE-2018-KraftSMWW0,
author = "Kira Kraft and Chirag Sudarshan and Deepak M. Mathew and Christian Weis and Norbert Wehn and Matthias Jung 0001",
booktitle = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2018.8342249",
isbn = "978-3-9819263-0-9",
pages = "1492--1495",
publisher = "{IEEE}",
title = "{Improving the error behavior of DRAM by exploiting its Z-channel property}",
year = 2018,
}