An analysis on retention error behavior and power consumption of recent DDR4 DRAMs
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Deepak M. Mathew, Martin Schultheis, Carl Christian Rheinländer, Chirag Sudarshan, Christian Weis, Norbert Wehn, Matthias Jung 0001
An analysis on retention error behavior and power consumption of recent DDR4 DRAMs
DATE, 2018.

DATE 2018
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@inproceedings{DATE-2018-MathewSRSWW0,
	author        = "Deepak M. Mathew and Martin Schultheis and Carl Christian Rheinländer and Chirag Sudarshan and Christian Weis and Norbert Wehn and Matthias Jung 0001",
	booktitle     = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2018.8342023",
	isbn          = "978-3-9819263-0-9",
	pages         = "293--296",
	publisher     = "{IEEE}",
	title         = "{An analysis on retention error behavior and power consumption of recent DDR4 DRAMs}",
	year          = 2018,
}


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