Sudipta Mondal, Krishnendu Chakrabarty
Pre-assembly testing of interconnects in embedded multi-die interconnect bridge (EMIB) dies
DATE, 2018.
@inproceedings{DATE-2018-MondalC,
author = "Sudipta Mondal and Krishnendu Chakrabarty",
booktitle = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2018.8342038",
isbn = "978-3-9819263-0-9",
pages = "373--378",
publisher = "{IEEE}",
title = "{Pre-assembly testing of interconnects in embedded multi-die interconnect bridge (EMIB) dies}",
year = 2018,
}