Zhijian Pan, Miao Li, Jian Yao, Hong Lu 0012, Zuochang Ye, Yanfeng Li, Yan Wang
Low-cost high-accuracy variation characterization for nanoscale IC technologies via novel learning-based techniques
DATE, 2018.
@inproceedings{DATE-2018-PanLYLYLW,
author = "Zhijian Pan and Miao Li and Jian Yao and Hong Lu 0012 and Zuochang Ye and Yanfeng Li and Yan Wang",
booktitle = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2018.8342115",
isbn = "978-3-9819263-0-9",
pages = "797--802",
publisher = "{IEEE}",
title = "{Low-cost high-accuracy variation characterization for nanoscale IC technologies via novel learning-based techniques}",
year = 2018,
}
