@inproceedings{DATE-2018-ShiWWXL,
	author        = "Xin Shi and Fei Wu 0005 and Shunzhuo Wang and Changsheng Xie and Zhonghai Lu",
	booktitle     = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2018.8342205",
	isbn          = "978-3-9819263-0-9",
	pages         = "1241--1246",
	publisher     = "{IEEE}",
	title         = "{Program error rate-based wear leveling for NAND flash memory}",
	year          = 2018,
}