@inproceedings{DATE-2019-LinSHNTH,
	author        = "Ting-You Lin and Chauchin Su and Chung-Chih Hung and Karuna Nidhi and Chily Tu and Shao-Chang Huang",
	booktitle     = "{Proceedings of the 23rd Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2019.8714895",
	isbn          = "978-3-9819263-2-3",
	pages         = "1661--1666",
	publisher     = "{IEEE}",
	title         = "{Package and Chip Accelerated Aging Methods for Power MOSFET Reliability Evaluation}",
	year          = 2019,
}