Travelled to:2 × France
Collaborated with:∅ Y.Chen M.Huang G.Chen C.Lee
Talks about:interconnect (1) crosstalk (1) boundari (1) environ (1) random (1) measur (1) digit (1) delay (1) built (1) test (1)
Person: Chauchin Su
DBLP: Su:Chauchin
Contributed to:
20001994Wrote 2 papers:
- DATE-2000-SuCHCL #metric
- All Digital Built-in Delay and Crosstalk Measurement for On-Chip Buses (CS, YTC, MJH, GNC, CLL), pp. 527–531.
- EDAC-1994-Su #bound #random testing #testing
- Random Testing of Interconnects in A Boundary Scan Environment (CS), pp. 226–231.