@inproceedings{DATE-2019-YeA0LP,
	author        = "Wei Ye and Mohamed Baker Alawieh and Meng Li 0004 and Yibo Lin and David Z. Pan",
	booktitle     = "{Proceedings of the 23rd Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2019.8714960",
	isbn          = "978-3-9819263-2-3",
	pages         = "54--59",
	publisher     = "{IEEE}",
	title         = "{Litho-GPA: Gaussian Process Assurance for Lithography Hotspot Detection}",
	year          = 2019,
}