SafeMem: Exploiting ECC-Memory for Detecting Memory Leaks and Memory Corruption During Production Runs
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Feng Qin, Shan Lu, Yuanyuan Zhou
SafeMem: Exploiting ECC-Memory for Detecting Memory Leaks and Memory Corruption During Production Runs
HPCA, 2005.

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@inproceedings{HPCA-2005-QinLZ,
	author        = "Feng Qin and Shan Lu and Yuanyuan Zhou",
	booktitle     = "{Proceedings of the 11th International Conference on High-Performance Computer Architecture}",
	doi           = "10.1109/HPCA.2005.29",
	isbn          = "0-7695-2275-0",
	pages         = "291--302",
	publisher     = "{IEEE Computer Society}",
	title         = "{SafeMem: Exploiting ECC-Memory for Detecting Memory Leaks and Memory Corruption During Production Runs}",
	year          = 2005,
}

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