Feng Qin, Shan Lu, Yuanyuan Zhou
SafeMem: Exploiting ECC-Memory for Detecting Memory Leaks and Memory Corruption During Production Runs
HPCA, 2005.
@inproceedings{HPCA-2005-QinLZ,
author = "Feng Qin and Shan Lu and Yuanyuan Zhou",
booktitle = "{Proceedings of the 11th International Conference on High-Performance Computer Architecture}",
doi = "10.1109/HPCA.2005.29",
isbn = "0-7695-2275-0",
pages = "291--302",
publisher = "{IEEE Computer Society}",
title = "{SafeMem: Exploiting ECC-Memory for Detecting Memory Leaks and Memory Corruption During Production Runs}",
year = 2005,
}











