Johannes Keustermans, Wouter Mollemans, Dirk Vandermeulen, Paul Suetens
Automated Cephalometric Landmark Identification Using Shape and Local Appearance Models
ICPR, 2010.
@inproceedings{ICPR-2010-KeustermansMVS, author = "Johannes Keustermans and Wouter Mollemans and Dirk Vandermeulen and Paul Suetens", booktitle = "{Proceedings of the 20th International Conference on Pattern Recognition}", doi = "10.1109/ICPR.2010.603", isbn = "978-0-7695-4109-9", pages = "2464--2467", publisher = "{IEEE Computer Society}", title = "{Automated Cephalometric Landmark Identification Using Shape and Local Appearance Models}", year = 2010, }