Fabian Timm, Thomas Martinetz
Statistical Fourier Descriptors for Defect Image Classification
ICPR, 2010.
@inproceedings{ICPR-2010-TimmM,
author = "Fabian Timm and Thomas Martinetz",
booktitle = "{Proceedings of the 20th International Conference on Pattern Recognition}",
doi = "10.1109/ICPR.2010.1018",
isbn = "978-0-7695-4109-9",
pages = "4190--4193",
publisher = "{IEEE Computer Society}",
title = "{Statistical Fourier Descriptors for Defect Image Classification}",
year = 2010,
}











