Yaping Yan, Sheng Xiang, Hirokazu Asano, Shun'ichi Kaneko
Accumulated Aggregation Shifting Based on Feature Enhancement for Defect Detection on 3D Textured Low-Contrast Surfaces
ICPR, 2018.
@inproceedings{ICPR-2018-YanXAK,
author = "Yaping Yan and Sheng Xiang and Hirokazu Asano and Shun'ichi Kaneko",
booktitle = "{Proceedings of the 24th International Conference on Pattern Recognition}",
doi = "10.1109/ICPR.2018.8545501",
isbn = "978-1-5386-3788-3",
pages = "2965--2970",
publisher = "{IEEE Computer Society}",
title = "{Accumulated Aggregation Shifting Based on Feature Enhancement for Defect Detection on 3D Textured Low-Contrast Surfaces}",
year = 2018,
}
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