Ville Kyrki, Heikki Kälviäinen
High Precision 2-D Geometrical Inspection
ICPR, 2000.
@inproceedings{ICPR-v4-2000-KyrkiK, author = "Ville Kyrki and Heikki Kälviäinen", booktitle = "{Proceedings of the 15th International Conference on Pattern Recognition, Volume 4}", doi = "10.1109/ICPR.2000.903033", isbn = "0-7695-0750-6", pages = "4779--4782", publisher = "{IEEE Computer Society}", title = "{High Precision 2-D Geometrical Inspection}", year = 2000, }