Ville Kyrki, Heikki Kälviäinen
High Precision 2-D Geometrical Inspection
ICPR, 2000.
@inproceedings{ICPR-v4-2000-KyrkiK,
author = "Ville Kyrki and Heikki Kälviäinen",
booktitle = "{Proceedings of the 15th International Conference on Pattern Recognition, Volume 4}",
doi = "10.1109/ICPR.2000.903033",
isbn = "0-7695-0750-6",
pages = "4779--4782",
publisher = "{IEEE Computer Society}",
title = "{High Precision 2-D Geometrical Inspection}",
year = 2000,
}











