Effect of Test Set Minimization on Fault Detection Effectiveness
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W. Eric Wong, Joseph Robert Horgan, Saul London, Aditya P. Mathur
Effect of Test Set Minimization on Fault Detection Effectiveness
ICSE, 1995.

ICSE 1995
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@inproceedings{ICSE-1995-WongHLM,
	author        = "W. Eric Wong and Joseph Robert Horgan and Saul London and Aditya P. Mathur",
	booktitle     = "{Proceedings of the 17th International Conference on Software Engineering}",
	doi           = "10.1145/225014.225018",
	editor        = "Dewayne E. Perry and Ross Jeffrey and David Notkin",
	isbn          = "0-89791-708-1",
	pages         = "41--50",
	publisher     = "{ACM}",
	title         = "{Effect of Test Set Minimization on Fault Detection Effectiveness}",
	year          = 1995,
}

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