Improving test suites for efficient fault localization
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Benoit Baudry, Franck Fleurey, Yves Le Traon
Improving test suites for efficient fault localization
ICSE, 2006.

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@inproceedings{ICSE-2006-BaudryFT,
	author        = "Benoit Baudry and Franck Fleurey and Yves Le Traon",
	booktitle     = "{Proceedings of the 28th International Conference on Software Engineering}",
	doi           = "10.1145/1134299",
	editor        = "Leon J. Osterweil and Hans Dieter Rombach and Mary Lou Soffa",
	isbn          = "1-59593-375-1",
	pages         = "82--91",
	publisher     = "{ACM}",
	title         = "{Improving test suites for efficient fault localization}",
	year          = 2006,
}

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