Yanbing Yu, James A. Jones, Mary Jean Harrold
An empirical study of the effects of test-suite reduction on fault localization
ICSE, 2008.
@inproceedings{ICSE-2008-YuJH,
author = "Yanbing Yu and James A. Jones and Mary Jean Harrold",
booktitle = "{Proceedings of the 30th International Conference on Software Engineering}",
doi = "10.1145/1368088.1368116",
editor = "Wilhelm Schäfer and Matthew B. Dwyer and Volker Gruhn",
isbn = "978-1-60558-079-1",
pages = "201--210",
publisher = "{ACM}",
title = "{An empirical study of the effects of test-suite reduction on fault localization}",
year = 2008,
}











