Dan Hao, Lu Zhang, Hao Zhong, Hong Mei, Jiasu Sun
Eliminating Harmful Redundancy for Testing-Based Fault Localization Using Test Suite Reduction: An Experimental Study
ICSME, 2005.
@inproceedings{ICSM-2005-HaoZZMS, author = "Dan Hao and Lu Zhang and Hao Zhong and Hong Mei and Jiasu Sun", booktitle = "{Proceedings of the 21st International Conference on Software Maintenance}", doi = "10.1109/ICSM.2005.43", isbn = "0-7695-2368-4", pages = "683--686", publisher = "{IEEE Computer Society}", title = "{Eliminating Harmful Redundancy for Testing-Based Fault Localization Using Test Suite Reduction: An Experimental Study}", year = 2005, }