Dan Hao, Lu Zhang, Hao Zhong, Hong Mei, Jiasu Sun
Eliminating Harmful Redundancy for Testing-Based Fault Localization Using Test Suite Reduction: An Experimental Study
ICSME, 2005.
@inproceedings{ICSM-2005-HaoZZMS,
author = "Dan Hao and Lu Zhang and Hao Zhong and Hong Mei and Jiasu Sun",
booktitle = "{Proceedings of the 21st International Conference on Software Maintenance}",
doi = "10.1109/ICSM.2005.43",
isbn = "0-7695-2368-4",
pages = "683--686",
publisher = "{IEEE Computer Society}",
title = "{Eliminating Harmful Redundancy for Testing-Based Fault Localization Using Test Suite Reduction: An Experimental Study}",
year = 2005,
}











