Eliminating Harmful Redundancy for Testing-Based Fault Localization Using Test Suite Reduction: An Experimental Study
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Dan Hao, Lu Zhang, Hao Zhong, Hong Mei, Jiasu Sun
Eliminating Harmful Redundancy for Testing-Based Fault Localization Using Test Suite Reduction: An Experimental Study
ICSME, 2005.

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@inproceedings{ICSM-2005-HaoZZMS,
	author        = "Dan Hao and Lu Zhang and Hao Zhong and Hong Mei and Jiasu Sun",
	booktitle     = "{Proceedings of the 21st International Conference on Software Maintenance}",
	doi           = "10.1109/ICSM.2005.43",
	isbn          = "0-7695-2368-4",
	pages         = "683--686",
	publisher     = "{IEEE Computer Society}",
	title         = "{Eliminating Harmful Redundancy for Testing-Based Fault Localization Using Test Suite Reduction: An Experimental Study}",
	year          = 2005,
}

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