Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit Baudry, Yves Le Traon
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
ICST, 2010.
@inproceedings{ICST-2010-PerrouinSKBT, author = "Gilles Perrouin and Sagar Sen and Jacques Klein and Benoit Baudry and Yves Le Traon", booktitle = "{Proceedings of the Third International Conference on Software Testing, Verification and Validation}", doi = "10.1109/ICST.2010.43", isbn = "978-0-7695-3990-4", pages = "459--468", publisher = "{IEEE Computer Society}", title = "{Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines}", year = 2010, }