Tingting Yu, Myra B. Cohen
Guided Test Generation for Finding Worst-Case Stack Usage in Embedded Systems
ICST, 2015.
@inproceedings{ICST-2015-YuC,
author = "Tingting Yu and Myra B. Cohen",
booktitle = "{Proceedings of the Eighth IEEE International Conference on Software Testing, Verification and Validation}",
doi = "10.1109/ICST.2015.7102592",
isbn = "978-1-4799-7125-1",
pages = "1--10",
publisher = "{IEEE}",
title = "{Guided Test Generation for Finding Worst-Case Stack Usage in Embedded Systems}",
year = 2015,
}











