Donghwan Shin 0001, Doo-Hwan Bae
A Theoretical Framework for Understanding Mutation-Based Testing Methods
ICST, 2016.
@inproceedings{ICST-2016-ShinB,
author = "Donghwan Shin 0001 and Doo-Hwan Bae",
booktitle = "{Proceedings of the Ninth International Conference on Software Testing, Verification and Validation}",
doi = "10.1109/ICST.2016.22",
isbn = "978-1-5090-1827-7",
pages = "299--308",
publisher = "{IEEE Computer Society}",
title = "{A Theoretical Framework for Understanding Mutation-Based Testing Methods}",
year = 2016,
}
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