Dennis Reuling, Johannes Bürdek, Serge Rotärmel, Malte Lochau, Udo Kelter
Fault-based product-line testing: effective sample generation based on feature-diagram mutation
SPLC, 2015.
@inproceedings{SPLC-2015-ReulingBRLK,
author = "Dennis Reuling and Johannes Bürdek and Serge Rotärmel and Malte Lochau and Udo Kelter",
booktitle = "{Proceedings of the 19th International Software Product Line Conference}",
doi = "10.1145/2791060.2791074",
isbn = "978-1-4503-3613-0",
pages = "131--140",
publisher = "{ACM}",
title = "{Fault-based product-line testing: effective sample generation based on feature-diagram mutation}",
year = 2015,
}











