Eli Ben-Sasson, Madhu Sudan, Salil P. Vadhan, Avi Wigderson
Randomness-efficient low degree tests and short PCPs via epsilon-biased sets
STOC, 2003.
@inproceedings{STOC-2003-Ben-SassonSVW,
author = "Eli Ben-Sasson and Madhu Sudan and Salil P. Vadhan and Avi Wigderson",
booktitle = "{Proceedings of the 35th Annual ACM Symposium on Theory of Computing}",
doi = "10.1145/780542.780631",
isbn = "1-58113-674-9",
pages = "612--621",
publisher = "{ACM}",
title = "{Randomness-efficient low degree tests and short PCPs via epsilon-biased sets}",
year = 2003,
}











