@inproceedings{TestCom-2005-LeeJL,
	author        = "Jung Youp Lee and Seok Won Jung and Jongin Lim",
	booktitle     = "{Proceedings of the 17th International Conference on Testing of Communicating Systems}",
	doi           = "10.1007/11430230_19",
	isbn          = "3-540-26054-4",
	pages         = "275--288",
	publisher     = "{Springer International Publishing}",
	series        = "{Lecture Notes in Computer Science}",
	title         = "{Detecting Trapdoors in Smart Cards Using Timing and Power Analysis}",
	volume        = 3502,
	year          = 2005,
}